We analyze and examine technical surfaces and more...
As a competent user service lab with main focus on Scanning Probe Microscopy we carry out analytical and user-related investigations on practically all kind of technical surfaces. The lab is also open to students and researchers of other groups within the Physics Department to perform measurements on their own after training. Besides Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM), other imaging surface technologies like Confocal Laser Scanning Microscopy and Scanning Electron Microscopy (SEM) are also used for our analysis.
While AFM and SEM are powerful instruments to image the surface morphology of a specimen, X-ray photoelectron spectroscopy (XPS) is a widely used method of determining the chemical composition of a surface, this technique is also available for investigation.
In collaboration with the Nano Imaging Lab of the Swiss Nanoscience Institute these other techniques are also available.