As a competent user service lab with main focus on Scanning Probe Microscopy and Scanning Electron Microscopy, we carry out analytical and user-related investigations on practically all kind of technical surfaces. The lab is also open to students and researchers of other groups within the Physics Department to perform measurements on their own after training. Besides Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM), other imaging surface technologies like Confocal Laser Scanning Microscopy and Transmission Electron Microscopy (TEM) are also used for our analysis.
While AFM and SEM are powerful instruments to image the surface morphology of a specimen, X-ray photoelectron spectroscopy (XPS) is a widely used method of determining the chemical composition of a surface. In the research group of Laurent Marot at the Physics Department, this technique is also available for investigation.
As a part of the Technology Center of the Swiss Nanoscience Institut (SNI), founded in 2006, we see ourselves as the first drop-in center if it is about questions and problems related to technical surfaces. We take over contract research for industrial partners in the region and give technical assistance for new nanotechnology-related projects with companies in and around Basel.
For more information please go to >>